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TECHNICAL TALK ON DIGITAL DETECTOR – DDA DIFFERENTIATION AND NEW INDUSTRY STANDARD WITH UNMATCHED PORTABILITY, SMART & POWERFUL USM100 UT CONVENTIONAL DEVICE

Details

Organizer: Non-Destructive Testing Society (Singapore), Micro-Tech Supplies & Services Pte Ltd and Waygate Technologies
Venue: Training Room T1C, No. 9 Jurong Town Hall Road, TA Hub
Speaker: Mr. Denis Kiesel & Mr. Ken Low
Date: 12 Jul 2023
Time: 06:00pm - 09:00pm
Registration Close Date: 10 Jul 2023

 

ABSTRACT

 “Digital Detector – DDA differentiation”:

With the advances in Digital RT, new panels as well as different concepts and requirements with a view on the NDT environment need careful consideration. It is important to know the fundamental basics of any detector and also the speciality of new types and variants. With adherence to standards when used in a weld, to inherent and added properties the detectors need to have when used in a harsh environment, the choices can only be managed when we understand the technology from its roots. The Presentation on DRT makes an effort to go into the forming factors of DDA technology and requirements so we know what to look at when comparing the technology available.

“New industry standard with unmatched portability, smart & powerful USM100 UT conventional device”:

Industry 4.0 encompass digital trends & NDT is also moving along this trend to benefit from the real-time insight, reducing & eliminating costs due to existing inefficiencies. Waygate Technologies has always been the trendsetter & continues to be the leader in high-performance UT flaw portables by introducing new digital innovations & features in the new USM100.

Programme:

6.00 – 7.00 PM – Registration and Networking

7.00 – 8.00 PM – Technical Seminar

8.00 – 9.00 PM – Dinner

About the speaker:

Denis Kiesel is the Commercial Leader of F&DI (Film & Digital Imaging) APAC incl. China for Waygate Technologies, stationed in Singapore. In this position, his Team is responsible for the sales of Radiographic Film, Digital Detectors, CR and Imaging Devices. This includes Software, Data Management systems and X-Ray Generators. He joined GE in April 2005 at the German Ahrensburg facility as a Technical Support Manager X-Ray. Prior to joining GE, he worked for 8 years in the area of Optical Inspection for PCBs. Before his engagement in the Inspection Business, he received his certification as Measurement & Control engineer at BASF AG in Germany. Denis lived and worked in Asia for several years and is supporting the region for over 20 years of his professional career. In 2017 GE Inspection Technologies became part of Baker Hughes and in 2019 the name was changed from GE Inspection Technologies to Waygate Technologies.

Ken Low is Asia UT (Standard Portables) Sales Leader for Waygate Technologies, based in Singapore. Ken Low join GE Inspection Technologies in 2011 with more than 10 years of NDT experience in the OGC industry. He has ASNT Level 2 qualifications in various methods and work as NDT technical sales engineer prior to GE, familiar with ultrasonic, eddy current & radiographic testing. Ken joined GEIT as Product Sales Manager to develop and support the AUT business in Asia Pacific. Prior to that, he also set up GE Inspection Technologies Application Centre in Singapore. Before this, he worked at Olympus NDT, Singapore Technologies Aerospace & Singapore Airforce. In 2017, GE Inspection Technologies became part of Baker Hughes & renamed Waygate Technologies in 2019. Ken graduates from Ngee Ann Polytechnic (Singapore) with a diploma in Mechanical Engineering and holds a BSc(Hons) in Business Management from the University of Bradford(UK).

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